Hirokazu Sasaki, Satoshi Yamazaki, Yojiro Oba, Masato Onuma
Abstract
Small-Angle X-ray (SAXS) and Small-Angle Neutron scattering (SANS) were used to analyze metallic nanoparticles, artificial pins in high-temperature super遊雅堂 入金 エラーducting wires, and precipitates of copper alloys. Small-angle scattering provides an average information on the size, the shape and the spacing of these finely dispersed nanoscale structures. In order to ensure the validity of the SAXS or SANS profile analysis, it is necessary to make complementary use of real-space observation techniques such as TEM and 3-D atom probe. This paper illustrates several cases of their use.
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