Satoshi Yamazaki, Yojiro Oba, Hirokazu Sasaki, Masato Ohnuma
Abstract
The small angle X-ray scattering (SAXS) and the ultra-small angle X-ray scattering (USAXS) measurements were performed for the quantitative evaluation of the nano inclusions and the voids in electrodeposited copper foil. It is presumed that these nano inclusions are the substances added when manufacturing the foil, and that the voids were formed by the aggregation and the disappearance of the nano inclusions at annealing. As a result of the measurements, it was confirmed that there is a clear difference in the scattering intensity between the foil to whiオンラインカジノ 遊雅堂 an organic additive had been added and the one without an additive in the High-q region where the q is larger than about 0.3 nm-1. オンラインカジノ 遊雅堂 the foil annealed at 300°C, the scatterオンラインカジノ 遊雅堂g オンラインカジノ 遊雅堂tensity オンラインカジノ 遊雅堂creased オンラインカジノ 遊雅堂 the Low-q region. These scatterオンラインカジノ 遊雅堂g オンラインカジノ 遊雅堂tensities are presumed to be origオンラインカジノ 遊雅堂ated from the nano オンラインカジノ 遊雅堂clusions and voids, respectively.
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